专利摘要:
1. Scanning interferometer containing a beam splitter and two flat mirrors, distinguished by the fact that, in order to increase the measurement performance using an interferometer, it is equipped with a second beam splitter and an optical element installed between the beam splitters, each made in the form of a decider plate and placed sequentially one after another, the mirrors are arranged parallel to one another, reflecting surfaces one towards the other, and the optical element is filled into T-prism with basic A diamond shaped device with two reflecting and two radiation transmitting edges, optically coupled to the beam splitters through mirrors and mounted for rotation relative to symmetry lines.
公开号:SU1152533A3
申请号:SU792732746
申请日:1979-02-13
公开日:1985-04-23
发明作者:Ясны Ян
申请人:Польска Акадэмия Наук Институт Хэмии Физычнэй (Инопредприятие);
IPC主号:
专利说明:

2. Interferometer containing a beam splitter and two flat mirrors, characterized in that, in order to increase the measurement performance using an interferometer, it is equipped with an optical element and a second beam splitter, both beam splitters are prism-shaped with a base in the shape of a rectangle and a common beam-splitting layer The mirrors are angled to one another, the optical element is designed as a prism.
52533
identical to the beam splitter and installed between the beam splitters and mirrors with the possibility of rotation about the prism axis, perpendicular to its base and passing through its middle, and the beam splitters and mirrors are optically connected to each other through the optical element.
Priority points: 17,02.78 under Clause 1, 21.09.78 under item 2.
The invention relates to instrumentation engineering and can be used to measure the absolute wavelength, Fourier spectra of picosecond light pulses, as well as to study matter.
The closest in technical essence and the achieved effect to the invention is a scanning interferometer containing a beam splitter and two flat mirrors fl.
A disadvantage of the known interferometer is the low measurement performance due to the low speed — the increment of the difference in the path length of the optical paths, which makes it impossible to use it for high-speed measurements.
The aim of the invention is to increase the measurement performance using an interferometer.
In order to achieve the purpose of the invention, in the first embodiment, a scanning interferometer comprising a beam splitter and two flat mirrors is provided with a beam splitter and an optical element mounted between the beam splitters, each made in the form of a light separator plate and arranged sequentially one after the other, the mirrors are parallel to one another and reflecting surfaces meet one another, and the optical element is designed as a prism with a diamond-shaped base with two reflecting and two passes The radiation faces are optically coupled to the beam splitters through mirrors and mounted rotatably about the symmetry axis of the prism.
The purpose of the invention according to the second variant is achieved by the fact that the scanning interferometer containing a beam splitter and two flat mirrors is equipped with an optical element and a second beam splitter, both beam splitters are made in the outer prism with a rectangular base and a common beam separation layer, the mirrors are angled one to another the optical element is made in the form of a prisch identical to the beam splitter and installed between the beam splitters and the mirrors with the possibility of rotation relative to the axis of the prism, perpendicular directly to its base and passing through its middle, and the light-beamlers and mirrors, respectively, are optically coupled to each other through the optical element.
FIG. 1 shows the scanning of the interfer (1 meter in the first embodiment; in Fig. 2 - the same, in the second embodiment.
The scanning interferometer in both versions contains two beam splitters 1 and 2, two flat mirrors 3 and 4, and an optical element 5.
In the first case, in the scanning interferometer, the beam splitters 1 and 2 are each in the form of a beam splitter plate and are arranged in series one after the other, mirrors 3 and 4 are parallel to one another, reflecting surfaces facing each other, optical element 5 is installed between the splitters 1 and 2 and made in the form of a prism with a rhombus-shaped base, with two reflecting and two transmitted radiation faces, the element 5 is optically coupled to the beam splitters 1 and 2 through mirrors 3 and 4 and is installed with possible of rotation relative to the symmetry axis of the prism. In the second embodiment, both beamers of bodies 1 and 2 are made in the form of a prism with a base in the shape of a rectangle and a common beam-splitting layer 6, the mirrors 3 and 4 are angled one to the other, and the optical element 5 is made in the form of a prism identical to the beam-splitting and installed between beam splitters 1 and 2 and mirrors 3 and 4 rotatably with respect to the prism axis, perpendicular to its base and passing through its middle, and beam splitters 1 and 2 and mirror 3 and 4, respectively, are optically coupled to each other. element 5. The interferometer in the first embodiment works in the following way. The beam entering the interferometer falls on the beam splitter 1 and is divided into: two coherent beams, one of which is reflected from mirror 3, enters the optical element through a face, is reflected twice inside element 5 from opposite faces a and b, leaves the element 5 through the face c is reflected from mirror 4 and falls on the beam splitter 2, the second beam is first reflected from mirror 4, enters element 5 through face c, is reflected from faces "and, through face t leaves element 5, reflects from mirror 3 and falls on beam splitter 2 where it meets with ne torn beam. The coherent beams interfere with each other and exit the interferometer. The energy of the beams depends on the difference in the lengths of the optical paths of the coherent beams, and the optical path length of each of the coherent beams is measured along the entire path of method 3 by two light separating layers of CPC splitters 1. If element 5 rotates about the axis O, then the optical path of one of the coherent beams is reduced, and the second is lengthened. Around the position in which in fig. 1 shows element 5, there is a small area of rotation angle of element 5, inside which uniform rotation of optical element 5 produces a uniform increment of the difference in the lengths of optical paths of two coherent beams. Then the beam energy is modulated sinusoidally, and the modulation period depends on the speed of rotation of the element 5 and the wavelength of the light. Before measuring the modulated energy, the element 5 can be accelerated to a high rotational speed, and the measurement can be made in such a range of angles of rotation, in which the increment of the optical path length is uniform. In the optical element 5, in which the opposite faces are parallel to one another of six possible degrees, only one element is free, namely, rotation about an axis perpendicular to the base causes a change in the difference of the optical path lengths of coherent beams. Any translational or rotational movements of element 5 do not disturb the alignment of the interferometer. Such properties of the interferometer are retained when each of the coherent beams enters and leaves the optical element 5 through two opposite edges, and also reflects from the same two edges inside. In order for a particular direction of rotation of element 5 to shorten the optical path of one of the coherent beams and the second elongation, it is necessary to guide these beams inside element 5 so that the path of one beam will be a mirror image of the path of the second beam relative to one on the symmetry planes of the optical element 5, perpendicular prynom to the base of the prism in the form of which element 5 is made. According to the second variant, the interferometer works as follows. The optical element 5 rotates about an axis perpendicular to its base and passing through the middle of the base 0. Between the light
权利要求:
Claims (2)
[1]
1. A scanning interferometer containing a beam splitter and two flat mirrors, distinguishing ί- ο in that, in order to increase the performance of measurements with an interferometer, it is equipped with a second beam splitter and an optical element mounted between the beam splitters, each made in the form of a beam splitter plate and placed sequentially one after another, the mirrors are parallel to one another, reflecting surfaces one towards the other, and the optical element is made in the form of a prism with a base in the form of a rhombus with two reflecting and two radiation-transmitting faces, it is optically connected to the beam splitters through mirrors and mounted with the possibility of rotation about the axis of symmetry of the prism.
at _ ,,,, 1152533
[2]
2. An interferometer containing a beam splitter and two flat mirrors, characterized in that, in order to increase the measurement performance using the interferometer, it is equipped with an optical element and a second beam splitter, both beam splitter made in the form of a prism with a base in the form of a rectangle and a common beam splitter layer, mirrors located at an angle relative to one another, the optical element is made in the form of a prism identical to the beam splitter and installed between the beam splitters and mirrors with the possibility of rotation relative to the axis of the prism perpendicular to its base and passing through its middle, and the beam splitters and mirrors, respectively, are optically connected to each other through an optical element.
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同族专利:
公开号 | 公开日
GB2014754B|1982-06-16|
DE2906015A1|1979-08-23|
FR2417788A1|1979-09-14|
JPS54133156A|1979-10-16|
GB2014754A|1979-08-30|
FR2417788B1|1984-06-08|
引用文献:
公开号 | 申请日 | 公开日 | 申请人 | 专利标题

CH526090A|1970-06-29|1972-07-31|Genevoise Instr Physique|Digital display photoelectric microscope|DE2900899C2|1979-01-11|1983-04-14|Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen|Laser device for generating ultrashort laser radiation pulses|
DE2904836C2|1979-02-08|1990-04-26|Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften Ev, 3400 Goettingen, De|
SE445074B|1980-10-31|1986-05-26|Bofors Ab|DEVICE BY A CHOPPER|
US4654530A|1983-10-31|1987-03-31|Dybwad Jens P|Refractively scanned interferometer|
DE3476583D1|1983-12-22|1989-03-09|Deutsche Forsch Luft Raumfahrt|Interferometer|
GB2154019B|1984-02-10|1988-01-13|Zeiss Jena Veb Carl|Double-beam interferometer arrangement particularly for fourier-transform spectrometers|
DE3523382A1|1985-06-29|1987-01-08|Protop Bleile Gmbh|Interference arrangement for testing wavefronts|
US4915502A|1988-01-11|1990-04-10|Nicolet Instrument Corporation|Interferometer spectrometer having tiltable reflector assembly and reflector assembly therefor|
US5150172A|1988-01-11|1992-09-22|Nicolet Instrument Corporation|Interferometer spectrometer having tiltable reflector assembly and reflector assembly therefor|
US5159405A|1989-10-28|1992-10-27|Horiba, Ltd.|Multibeam interferometer for use in a fourier transform spectrometer and a driving device for moving the mirrors used therein|
EE04571B1|2001-02-15|2005-12-15|Wilfred Vince Cecil|Scanning interferometer|
CN101871816B|2010-06-03|2012-02-29|北京航空航天大学|Modularized split Sagnac interferometer|
法律状态:
优先权:
申请号 | 申请日 | 专利标题
PL20472978A|PL124767B1|1978-02-17|1978-02-17|Interferometer|
PL20974578A|PL127011B3|1978-09-27|1978-09-27|Interferometer|
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